Overview
DACrux/TEST provides a total solution for semiconductor test floor optimization in automatic data collection circumstances for yield analysis applications. DACrux is used to take prompt action for abnormal yield by analyzing and reporting test results in real-time. DACrux/TEST provides standardized data which complies with SEMI standards, IE422 spec. Therefore, supports correlated analysis with other data and provides base for yield modeling. 
 
 
Features

∙ Operation
Clear a work guide for the operator and engineer Prevent human error and other errors of subjective operation  Reduce fixed and repetitive manual work Maximize processing, engineering efficiency and productivity  Provide data accuracy with auto data collection
 
∙ Analysis
Easy visual analysis Systematic test and defect data collection Yield management and analysis Yield modeling by analyzing the yield loss factors
 
∙ Reporting
Real-time yield monitoring Alarm for the yield ripple Prompt process feedback for yield ripple Properly adjust the production capacity and the yield Provide analysis report for decision-making
 
∙ Visualizations
Graph displays data visualization through pie chart, bar chart, trend chart, scatter plot, box plot and also other specialized graphs can be customized.
 
∙ Additional Functions
Users can easily access quality data through analysis knowledge sharing on the web. Users can process a particular data by selecting an area on the graph or data sheet. DACrux/STAT provides office interface to easily export analysis results to office document through a dynamic chart link.
 
∙ End User Computing Environments
Users can directly access DB and use data to analyze. Now users can require necessary data from IT department according to the existing methods and in addition tedious processes and waiting time are reduced. An reply for request changes is immediately provided.