Overview
Enterprise yield management solution is necessary for the environment of the manufacturing corporation when problematic phenomenon such as failing to abide by the scheduled production, maintain unstable and inefficient expenditures, declining productivity or low customer satisfaction surfaces. The core of these problems lies in inaccessibility of adequate manufacturing quality data at the right time, therefore slowing down the response to yield management problems. To confront these problems, corporations are increasingly turning to YMS (Yield Management System) for increase in data access ability. Using YMS enables connection with MES system and visualizes the manufacturing information to lead to a better understanding of the manufacturing quality and to gain easier grasp of mechanical problems. Also, QMS (Quality Management System) enables management of measure data, which cannot be visualized, by turning them into statistical form. This also is a necessary component in increasing predictability for manufacturers.Miracom provides applicable solution for systematic materialization of high-tech manufacturing sector's YMS and overall manufacturing sectors' QMS, so they can effectively confront the increasingly complicating manufacturing processes.
 
 
Solution
Miracom’s Quality Management solution collects mass data (data given by Legacy System, i.e. MES, ERP, etc) including product test results and it uses high-tech statistical analysis methods (Regression, Multivariate Analysis, etc) as well as Machine Learning technique (Decision Tree, Neural Network) or Pattern Recognition technique to analyze the useful information (error cause deduction, yield prediction, etc.).

∙ In high-tech industries, including semiconductor / FPD, the most important management indicators can be substituted into
- the yield. High-tech industries put a lot of effort to improve the yield by paying huge costs.

∙ Various engineering data occurred in production activities should be systematically managed and all data must be analyzed.

∙ The state of process shall be promptly identified and responded through the diverse and comprehensive analysis of Probe Test,PCM Test, Defect Inspection, Defect Review Image, Inline Measurement Data in order to improve the yield of newlyof process shall be promptly identified and responded through the diverse and comprehensive analysis of Probe Test,
- developed products over a certain level.

∙ Quality analysis in high-tech industry should use visual Map analysis and statistical analysis in order to find out the anomaly and the problem of data by analyzing the correlation between significant factors that affects on the yield.

∙ improvement about product quality must be present and the same problem should be reduced through further estimation and verification in future.

∙ proven analysis methods should be built into the system to prevent quality problem in the bulk by automating the analytical procedure.

∙ effective and valid quality analysis process and knowledge for quality improvement should be stored and shared. It may help an engineer analyze the cause of the failure.

∙ Various types of data formed by diverse process should be organized by a series to understand the relationship easily.